Electronic Design

Charged Device Model (CDM) ESD Testing: Getting a Clearer Picture

Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid discharge, ...
Semiconductor Engineering

Assessing ESD Sensitivity Of Interface IP Using Charged Device Model

An electronic device is susceptible to Electrostatic Discharge (ESD) damage during its entire life cycle, especially from the completion of the silicon wafer processing to when the device is assembled ...
Electronic Design

What’s The Difference Between HBM, CDM, And MM Test?

This file type includes high resolution graphics and schematics when applicable. EOS and ESD may be caused by the user’s application due to a transient, excessive supply current, poor grounding, low ...
EDN

ESD protection design for discrete semiconductors

Electrostatic discharge (ESD) is caused by the discharge of an excess or deficiency of electrons on one surface with respect to another surface or to ground. When a static charge is present on an ...
EDN

FA leads to proper ESD tests

At our company, we used failure analysis (FA) to successfully determine what caused GaAs RF ICs to fail during retesting. In our case, the source of the damage turned out to be just as important as ...