Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.
EDA start-up DeFacTo Technologies has the ambitious goal of making obsolete gate-level DFT (design for test) by moving DFT further up in the IC-design process to the RTL (register-transfer level) ...
New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...
Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
Blast DFT complements Dolphin's advanced memory technology for demonstrably significant yield gains and ease of integration SANTA CLARA, Calif. and SAN JOSE, Calif. -- April 11, 2005-- Magma(R) Design ...
Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
As the demand for processing power for artificial intelligence (AI) applications grows, semiconductor companies are racing to develop AI-specific silicon. The AI market is incredibly dynamic, with ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback