Abstract: This article proposes a novel analytical fault model for permanent magnet machines with interturn short-circuits that considers the influence of various factors on the fault current. These ...
Image2Net: Datasets, Benchmark and Hybrid Framework to Convert Analog Circuit Diagrams into Netlists
Abstract: Large Language Model (LLM) exhibits great potential in designing of analog integrated circuits (IC) because of its excellence in abstraction and generalization for knowledge. However, ...
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